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Play, download and edit the free video Machine Learning (ML) based Incident/Defect turnaround Cognitive Processor By Ashish Agarwal and Swaroop Rajendra.

DOIS21 speakers Ashish Agrawal and Swaroop Rajendra’s Machine Learning (ML) based Incident/Defect turnaround Cognitive Processor” address the problem of turning around incidents/defects in a short time through an innovative and implementable solution via a cognitive Processor using a stack of ML algorithms comprising of NLP, Classification and Similarity algorithms.

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